A Built-In-Test Circuit for Functional Verification & PVT\ud Variations Monitoring of CMOS RF Circuits

摘要

Built-In-Test (BIT) for Radio Frequency (RF) integrated circuits can reduce\udthe testing cost, especially with the increase of integration level and operating frequency.\udA fully integrated CMOS BIT detection circuit is presented in this work. This BIT\uddetection circuit is rectifier-based and low threshold voltage diode-connected MOS\udtransistor with substrate positively-biased is used to improve the detecting sensitivity.\udAs an example, a 2.4GHz LNA is used, the high frequency small signal gain is extracted\udand the gain fluctuation due to Process, supply Voltage and Temperature (PVT)\udvariations is also investigated. The simulation results show that this BIT detection\udcircuit can realize on-chip functional verification of RF circuits and also monitor the\udinfluence of PVT variations on the performance of the circuit without affecting the high\udfrequency performance of the measured RF circuits.